Saratech: A Comparison of Implicit and Explicit Solutions for Electronics Drop Testing Simulation

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The information below was gathered from the 2018 Simcenter Conference - Americas that took place October 15-17 in Detroit, Michigan.


Author: Connor McCauley, Staff Engineer


The authors will present a comparison of a simulated drop test of a representative smartphone using NX Nastran Solution 402 and Solution 701.  This will discuss modeling strategies, a comparison of runtimes, and differences in observed results.  Recommendations for modeling best practices when using Solution 402 for nonlinear dynamic simulations will also be presented.